IEEE Open Journal of the Solid-State Circuits Society
ISSN:
2644-1349
Publisher:
New York NY: IEEE Solid-State Circuits Society; Institute of Electrical and Electronics Engineers, [2021]-
Country:
United States
ES-FAC
ES-FAC B
Eurascience Journal Classification System
📄 Articles published in this journal
- A Pipelined Incremental ΔΣ ADC With Residue Harvesting and Noise Penalty Mitigation 2026
- A Time-Interleaved ADC with a Single-Step Relative-Prime-Rotation-Based Background Timing-Skew Calibration Using MAD-Averaging 2026
- A 40-nm 30.69-TOPS/W Weight Sharing FC-DNN Engine for Audio Processing Using CAM-Based In-Memory Search and DIMC-Based Approximate Computing 2026
- An Overview of Time-Interleaved Noise-Shaping ADCs: Fundamentals, Challenges, and Prospects 2026
- ESD Protection Design: Fundamentals and Advanced Strategies 2026
- Power Management Circuit Techniques for Miniature Biomedical Sensing Systems 2026
- Robust and Scalable Cell-Based 65-nm CMOS RO-PUF Implementation 2026
- Ultrafast Time-Compressive CMOS Image Sensors Based on Multitap Charge Modulators for Filming Light-In Flight 2026
- Hardware Optimization of Cryptographic Algorithms on RISC-V for Embedded Applications 2026
- Non-Volatile Digital Compute-in-Memory Macro with Ferroelectric FET-based Voltage Divider Weight Cells Featuring Power-Gating 2026